The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Apr. 07, 2006
Applicant:
Eiichi Hayashi, Atsugi, JP;
Inventor:
Eiichi Hayashi, Atsugi, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G02B 26/10 (2006.01); G02B 26/12 (2006.01); G02B 13/00 (2006.01); B29C 45/17 (2006.01); B29C 45/56 (2006.01); B29D 11/00 (2006.01);
U.S. Cl.
CPC ...
G02B 13/0005 (2013.01); B29C 45/174 (2013.01); B29C 45/56 (2013.01); B29D 11/00 (2013.01);
Abstract
A plastic optical element being configured to collect and scan a beam emitted from at least one light source section, and including a transfer surface which extends in a principal direction corresponding to a scanning direction of the beam and has a curved surface formed to extend into a circular-arc shape in a secondary direction perpendicular to the principal scanning direction, the transfer surface having an optical aids disposed to shift from an outer center of the transfer surface in the secondary scanning direction, and a center of curvature of the curved surface being disposed on the optical axis.