Date of Patent: Sep. 29, 2015 Applicants:
John Trezza , Nashua, NH (US) ;
John Callahan , Wilmington, MA (US) ;
Gregory Dudoff , Amherst, NH (US) ;
Int. Cl.
CPC ...
H01L 21/48 (2006.01) ; H01L 23/427 (2006.01) ; H01L 21/683 (2006.01) ; H01L 21/768 (2006.01) ; H01L 23/48 (2006.01) ; H01L 23/498 (2006.01) ; H01L 23/538 (2006.01) ; H01L 23/552 (2006.01) ; H01L 23/66 (2006.01) ; H01L 23/00 (2006.01) ; H01L 25/065 (2006.01) ; H01L 25/18 (2006.01) ; H01L 25/00 (2006.01) ; H01L 23/488 (2006.01) ; H01S 5/022 (2006.01) ; H01S 5/042 (2006.01) ; H01S 5/183 (2006.01) ;
U.S. Cl.
CPC ...
H01L 23/427 (2013.01) ; H01L 21/4853 (2013.01) ; H01L 21/6835 (2013.01) ; H01L 21/76898 (2013.01) ; H01L 23/48 (2013.01) ; H01L 23/481 (2013.01) ; H01L 23/488 (2013.01) ; H01L 23/49827 (2013.01) ; H01L 23/5389 (2013.01) ; H01L 23/552 (2013.01) ; H01L 23/66 (2013.01) ; H01L 24/02 (2013.01) ; H01L 24/11 (2013.01) ; H01L 24/13 (2013.01) ; H01L 24/16 (2013.01) ; H01L 24/24 (2013.01) ; H01L 24/75 (2013.01) ; H01L 24/81 (2013.01) ; H01L 25/0652 (2013.01) ; H01L 25/0657 (2013.01) ; H01L 25/18 (2013.01) ; H01L 25/50 (2013.01) ; H01S 5/0425 (2013.01) ; H01L 2221/68345 (2013.01) ; H01L 2221/68363 (2013.01) ; H01L 2221/68368 (2013.01) ; H01L 2223/6616 (2013.01) ; H01L 2223/6622 (2013.01) ; H01L 2224/02372 (2013.01) ; H01L 2224/0401 (2013.01) ; H01L 2224/114 (2013.01) ; H01L 2224/116 (2013.01) ; H01L 2224/1147 (2013.01) ; H01L 2224/11912 (2013.01) ; H01L 2224/136 (2013.01) ; H01L 2224/1308 (2013.01) ; H01L 2224/13012 (2013.01) ; H01L 2224/1358 (2013.01) ; H01L 2224/13082 (2013.01) ; H01L 2224/13083 (2013.01) ; H01L 2224/13084 (2013.01) ; H01L 2224/13111 (2013.01) ; H01L 2224/13144 (2013.01) ; H01L 2224/13147 (2013.01) ; H01L 2224/13155 (2013.01) ; H01L 2224/13166 (2013.01) ; H01L 2224/13184 (2013.01) ; H01L 2224/13609 (2013.01) ; H01L 2224/16146 (2013.01) ; H01L 2224/16237 (2013.01) ; H01L 2224/24226 (2013.01) ; H01L 2224/75 (2013.01) ; H01L 2224/75305 (2013.01) ; H01L 2224/81001 (2013.01) ; H01L 2224/81011 (2013.01) ; H01L 2224/81054 (2013.01) ; H01L 2224/81136 (2013.01) ; H01L 2224/81193 (2013.01) ; H01L 2224/81203 (2013.01) ; H01L 2224/81204 (2013.01) ; H01L 2224/81825 (2013.01) ; H01L 2224/81894 (2013.01) ; H01L 2224/83102 (2013.01) ; H01L 2224/92125 (2013.01) ; H01L 2225/06513 (2013.01) ; H01L 2225/06524 (2013.01) ; H01L 2225/06531 (2013.01) ; H01L 2225/06534 (2013.01) ; H01L 2225/06541 (2013.01) ; H01L 2225/06555 (2013.01) ; H01L 2225/06589 (2013.01) ; H01L 2225/06593 (2013.01) ; H01L 2225/06596 (2013.01) ; H01L 2924/00013 (2013.01) ; H01L 2924/01002 (2013.01) ; H01L 2924/0103 (2013.01) ; H01L 2924/014 (2013.01) ; H01L 2924/01004 (2013.01) ; H01L 2924/0105 (2013.01) ; H01L 2924/01005 (2013.01) ; H01L 2924/01006 (2013.01) ; H01L 2924/01007 (2013.01) ; H01L 2924/01012 (2013.01) ; H01L 2924/01013 (2013.01) ; H01L 2924/01014 (2013.01) ; H01L 2924/01018 (2013.01) ; H01L 2924/01022 (2013.01) ; H01L 2924/01023 (2013.01) ; H01L 2924/01024 (2013.01) ; H01L 2924/01025 (2013.01) ; H01L 2924/01027 (2013.01) ; H01L 2924/01028 (2013.01) ; H01L 2924/01029 (2013.01) ; H01L 2924/01032 (2013.01) ; H01L 2924/01033 (2013.01) ; H01L 2924/01042 (2013.01) ; H01L 2924/01046 (2013.01) ; H01L 2924/01047 (2013.01) ; H01L 2924/01049 (2013.01) ; H01L 2924/01051 (2013.01) ; H01L 2924/01052 (2013.01) ; H01L 2924/01073 (2013.01) ; H01L 2924/01074 (2013.01) ; H01L 2924/01075 (2013.01) ; H01L 2924/01078 (2013.01) ; H01L 2924/01079 (2013.01) ; H01L 2924/01082 (2013.01) ; H01L 2924/04953 (2013.01) ; H01L 2924/05042 (2013.01) ; H01L 2924/09701 (2013.01) ; H01L 2924/10253 (2013.01) ; H01L 2924/10329 (2013.01) ; H01L 2924/14 (2013.01) ; H01L 2924/19041 (2013.01) ; H01L 2924/19043 (2013.01) ; H01L 2924/3011 (2013.01) ; H01L 2924/3025 (2013.01) ; H01L 2924/30105 (2013.01) ; H01S 5/02272 (2013.01) ; H01S 5/0422 (2013.01) ; H01S 5/183 (2013.01) ; H01S 5/18308 (2013.01) ; H01S 2301/176 (2013.01) ;
Abstract An electrical connection between two chips includes an IC pad on a first chip, an IC pad on a second chip, a first barrier metal over the IC pad of the first chip, a second barrier metal over the IC pad of the second chip, a malleable electrically conductive metal, different from the barrier metals, trapped between the first barrier metal and the second barrier metal, the first barrier metal, the malleable conductive metal and the second barrier metal forming a complete electrically conductive path between the IC pad of the first chip and the IC pad of the second chip.
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Cite this Patent (APA, Harvard, BibTeX)
Trezza, John. (2015). Contact-based encapsulation (U.S. Patent No. 9147635). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9147635
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