The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Sep. 22, 2014
Applicant:

Anapass Inc., Seoul, KR;

Inventors:

Daehyun Kim, Seoul, KR;

Tae Jin Kim, Seoul, KR;

Jae Hun Lee, Seoul, KR;

Assignee:

ANAPASS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4652 (2013.01); G06K 9/34 (2013.01);
Abstract

Provided are a method of detecting a transition area and an apparatus for processing an image using the same. The apparatus includes a line representative value calculator configured to calculate line representative values of an image including a non-image display area, an image display area, and a transition area interposed between the non-image display area and the image display area, and a transition area detector configured to calculate first-order and second-order differentiations of the line representative values, calculate a threshold value of the transition area using first-order and second-order-differentiation-representative-values of a first line group including a plurality of lines in a window including a plurality of lines and first-order and second-order-differentiation-representative-values of a second line group including a plurality of lines, and detect the transition area.


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