The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Mar. 18, 2013
Applicant:

National Taiwan University, Taipei, TW;

Inventors:

Si-Chen Lee, Taipei, TW;

Hung-Hsin Chen, Taipei, TW;

Chun-Han Chen, Changhua, TW;

Shang-Ru Tsai, Taichung, TW;

Shi-Ming Lin, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/3504 (2014.01); G01J 3/10 (2006.01); G01N 21/35 (2014.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01J 3/10 (2013.01); G01J 2003/1213 (2013.01); G01J 2003/1282 (2013.01); G01N 21/35 (2013.01);
Abstract

A gas detection system comprising a case having a hollow chamber, a gas input port, a gas output port, a radiation emitting device, and a photo detector. The gas input port may be disposed on the case for a test gas flowing into the chamber. The gas output port may be disposed on the case for the test gas flowing out of the chamber. The radiation emitting device may be disposed on the case and operated in a surface plasmonic mode or a waveguide mode for emitting a narrow bandwidth thermal radiation light source with multi-peak wavelengths into the chamber, wherein the multi-peak wavelengths may comprise a first absorption wavelength and a second absorption wavelength of the test gas. The photo detector may be disposed on the case for detecting light intensity of the light source passing through the chamber to determine the concentration of the test gas.


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