The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Oct. 21, 2009
Marco Pausini, Torre de Benagalbon, ES;
Jochen Rivoir, Magstadt, DE;
Marco Pausini, Torre de Benagalbon, ES;
Jochen Rivoir, Magstadt, DE;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
Systems and methods for measuring a phase noise of a test signal. A test system includes a recursive delayer, a combiner and a phase noise determinator. The recursive delayer is configured to provide a recursively delayed signal on the basis of the test signal. The combiner is configured to combine a first signal with a second signal to provide a combiner output signal. The first signal is generated based on the test signal and the second signal is generated based on the recursively delayed signal. The phase noise determinator is used to determine phase noise information based on the combiner output signal.