The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Apr. 26, 2013
Applicant:

Kaneka Corporation, Osaka-shi, Osaka, JP;

Inventors:

Yasunori Tanaka, Kanazawa, JP;

Masahiro Ishida, Kanazawa, JP;

Naoki Shinsei, Kanazawa, JP;

Hiroyasu Hagi, Takasago, JP;

Atsushi Mizobuchi, Osaka, JP;

Assignee:

KANEKA CORPORATION, Osaka-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/02 (2006.01); G01R 31/00 (2006.01); G01R 31/12 (2006.01);
U.S. Cl.
CPC ...
G01R 27/02 (2013.01); G01R 31/1218 (2013.01); G01R 31/1263 (2013.01);
Abstract

The present device includes a high frequency induction thermal plasma generation unit; a second tube portion, which is connected to a first tube portionand which includes windowon at least one side surface; and a testing subject installing pedestalconfigured to be fixedly attached at a reference position in the second tube portion, wherein the testing subject installing pedestalincludes a seating portion for installing the testing subject, and a hold-down portion for fixing the installed testing subjectwith a part of the testing subject exposed; and an ablated vapor generated from the testing subject is observed through the window from an outer side of the second tube portion.


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