The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Aug. 13, 2013
Applicant:

Lesaffre ET Compagnie, Paris, FR;

Inventors:

Jean-Marc Ladriere, Querenaing, FR;

Jean-Charles Bartolucci, Saint Andre-lez-Lille, FR;

Fabienne Sucher, Marcq-en-Baroeul, FR;

Benoit Thomas, Marquette-lez-Lille, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A21D 8/04 (2006.01); C12N 15/81 (2006.01); A21D 2/14 (2006.01); C12N 1/18 (2006.01); C12N 15/01 (2006.01);
U.S. Cl.
CPC ...
A21D 8/047 (2013.01); A21D 2/145 (2013.01); C12N 1/18 (2013.01); C12N 15/01 (2013.01); C12N 15/81 (2013.01);
Abstract

The present invention relates tostrains suitable for the production of baker's yeasts which are osmotolerant and which exhibit intrinsic resistance to weak organic acids. The strains of the present invention are obtained by means of a process of hybridization or of mutation of the industrialstrain deposited on Jul. 8, 2010 with the CNCM [French National Collection of Microorganism Cultures] under number I-4341, or from an industrial strain related thereto via the Ty profile thereof and/or via quantitative trait locus mapping (QTL mapping).


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