The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Nov. 08, 2012
Applicants:

Yuan LU, San Jose, CA (US);

Nitin Mhaske, Santa Clara, CA (US);

Yunshan Zhu, Cupertino, CA (US);

Inventors:

Yuan Lu, San Jose, CA (US);

Nitin Mhaske, Santa Clara, CA (US);

Yunshan Zhu, Cupertino, CA (US);

Assignee:

Atrenta, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5022 (2013.01);
Abstract

Systems and methods for functionally verifying the performance of a system on a chip (SOC) are provided herein. According to some embodiments, the methods may include at least the steps of analyzing a verification log, via a functional verification system, to determine signatures by correlating a pattern of at least one of triggered and untriggered assertions in one or more blocks of a plurality of blocks to behaviors of at least one of the SOC and the one or more blocks of the plurality of blocks. Exemplary methods also include categorizing signatures according to the behaviors, and storing similar signatures based upon the categorization in a database.


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