The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9135103 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 15, 2015

Filed:

Feb. 15, 2013
Applicant:

Mentor Graphics Corporation, Wilsonville, OR (US);

Inventors:

Yu Huang, Sudbury, MA (US);

Wu-Tung Cheng, Lake Oswego, OR (US);

Christopher W. Schuermyer, Happy Valley, OR (US);

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06N 3/02 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06N 3/02 (2013.01); G11C 29/56008 (2013.01);
Abstract

Aspects of the invention relate to techniques for classifying memory failure bitmaps using both rule-based classification and artificial neural network-based classification methods. The rule-based classification method employs classification rules comprising those for global failure patterns. The artificial neural network-based classification method classifies local failure patterns. One of the artificial neural network models is the Kohonen self-organizing map model. The input vector for a failure pattern may contain four elements: pattern aspect ratio, failing bit ratio, dominant failing column number and dominant failing row number.


Find Patent Forward Citations

Huang, Yu. (2015). Hybrid memory failure bitmap classification (U.S. Patent No. 9135103). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9135103

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