The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9129802 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 08, 2015

Filed:

Aug. 22, 2013
Applicant:

Rf Micro Devices, Inc., Greensboro, NC (US);

Inventor:

Andrew P. Ritenour, Colfax, NC (US);

Assignee:

RF Micro Devices, Inc., Greensboro, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 27/02 (2006.01); H01L 29/417 (2006.01); H01L 29/778 (2006.01); H01L 29/861 (2006.01); H01L 29/20 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0248 (2013.01); H01L 29/4175 (2013.01); H01L 29/41775 (2013.01); H01L 29/2003 (2013.01); H01L 29/778 (2013.01); H01L 29/861 (2013.01);
Abstract

A lateral semiconductor device having a vertical region for providing a protective avalanche breakdown (PAB) is disclosed. The lateral semiconductor device has a lateral structure that includes a conductive substrate, semi-insulating layer(s) disposed on the conductive substrate, device layer(s) disposed on the semi-insulating layer(s), along with a source electrode and a drain electrode disposed on the device layer(s). The vertical region is separated from the source electrode by a lateral region wherein the vertical region has a relatively lower breakdown voltage level than a relatively higher breakdown voltage level of the lateral region for providing the PAB within the vertical region to prevent a potentially damaging breakdown of the lateral region. The vertical region is structured to be more rugged than the lateral region and thus will not be damaged by a PAB event.


Find Patent Forward Citations

Ritenour, Andrew. (2015). Lateral semiconductor device with vertical breakdown region (U.S. Patent No. 9129802). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9129802

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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