The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Apr. 12, 2011
Applicant:
Hee-wook You, Anyang-si, KR;
Inventor:
Hee-Wook You, Anyang-si, KR;
Assignee:
KOH YOUNG TECHNOLOGY INC., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/235 (2006.01); G01N 21/88 (2006.01); G01N 21/956 (2006.01); H04N 13/02 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2354 (2013.01); G01N 21/8806 (2013.01); G01N 21/95684 (2013.01); H04N 5/2351 (2013.01); H04N 13/0253 (2013.01);
Abstract
In order to establish a lighting intensity of an inspection apparatus, an inspection board is installed in an inspection apparatus. Then, a width of a histogram of a captured image acquired through a camera of the inspection apparatus is adjusted to avoid from a dark region and a bright region. Thereafter, a lighting intensity of the inspection apparatus is adjusted by adjusting the histogram to be near a middle of a graph. Thus, a setting time of an inspection condition stored in a job file may be reduced to increase the user's convenience, and measurement error due to mis-establishment may be reduced to enhance inspection precision.