The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Dec. 21, 2011
Applicants:

Daniel J. Zierath, Portland, OR (US);

Shaestagir Chowdhury, Beaverton, OR (US);

Chi-hwa Tsang, Beaverton, OR (US);

Inventors:

Daniel J. Zierath, Portland, OR (US);

Shaestagir Chowdhury, Beaverton, OR (US);

Chi-Hwa Tsang, Beaverton, OR (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/485 (2006.01); H01L 21/768 (2006.01); H01L 23/538 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 23/485 (2013.01); H01L 21/76831 (2013.01); H01L 21/76844 (2013.01); H01L 21/76846 (2013.01); H01L 21/76849 (2013.01); H01L 21/76864 (2013.01); H01L 21/76874 (2013.01); H01L 21/76877 (2013.01); H01L 21/76879 (2013.01); H01L 23/5384 (2013.01); H01L 23/53238 (2013.01); H01L 23/53252 (2013.01); H01L 23/53266 (2013.01); H01L 2924/0002 (2013.01);
Abstract

Techniques are disclosed that enable interconnects, vias, metal gates, and other conductive features that can be formed through electroless material deposition techniques. In some embodiments, the techniques employ electroless fill in conjunction with high growth rate selectivity between an electroless nucleation material (ENM) and electroless suppression material (ESM) to generate bottom-up or otherwise desired fill pattern of such features. Suitable ENM may be present in the underlying or otherwise existing structure, or may be provided. The ESM is provisioned so as to prevent or otherwise inhibit nucleation at the ESM covered areas of the feature, which in turn prevents or otherwise slows down the rate of electroless growth on those areas. As such, the electroless growth rate on the ENM sites is higher than the electroless growth rate on the ESM sites.


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