The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
May. 15, 2012
Guozhong Shen, San Jose, CA (US);
Bart Decanne, Sunnyvale, CA (US);
Kenneth W. Knox, Palo Alto, CA (US);
Muhammad Umair, Santa Clara, CA (US);
Syed F. Ahmad, Sunnyvale, CA (US);
Guozhong Shen, San Jose, CA (US);
Bart DeCanne, Sunnyvale, CA (US);
Kenneth W. Knox, Palo Alto, CA (US);
Muhammad Umair, Santa Clara, CA (US);
Syed F. Ahmad, Sunnyvale, CA (US);
Qualcomm Technologies, Inc., San Diego, CA (US);
Abstract
A capacitive touch panel is tested for the presence or absence of short and open circuits in drive and sense lines without the use of a tool that touches the surface of the panel. During a first stage of testing, drive lines of the touch panel are sequentially driven while the remaining drive lines are floated. Sense lines are read to indicate whether a driven drive line is shorted to an adjacent drive line, an open circuit, or coupled to a sense line that is an open circuit. During a second stage of testing, drive lines are driven while alternate sense lines are floated or enabled. The signals on the enabled sense lines are acquired to indicate whether the enabled sense lines are shorted to adjacent sense lines. This second stage can be repeated, switching the roles of the sense lines, to determine the locations of short and/or open circuits.