The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Oct. 17, 2013
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Shinichi Hamaguchi, Tokyo, JP;

Masaki Kurokawa, Tokyo, JP;

Masahiro Takizawa, Tokyo, JP;

Assignee:

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/20 (2012.01); G03F 7/20 (2006.01); H01J 37/317 (2006.01); G03F 1/50 (2012.01);
U.S. Cl.
CPC ...
G03F 7/2037 (2013.01); G03F 1/20 (2013.01); H01J 37/3174 (2013.01); G03F 1/50 (2013.01); G03F 7/2063 (2013.01); H01J 2237/31776 (2013.01);
Abstract

An electron beam exposure method includes the steps of: preparing an exposure mask having a plurality of opening patterns formed by dividing a drawing object pattern into exposable regions; and drawing the drawing object pattern by performing exposure with an electron beam passing through the opening patterns of the exposure mask. Each end portion serving as a joint in each opening pattern of the exposure mask is provided with a joining portion tapered in a width of the opening pattern. The exposure is performed in such a way that portions drawn through adjacent joining portions overlap each other.


Find Patent Forward Citations

Loading…