The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Aug. 30, 2013
Applicant:

Picarro, Inc., Santa Clara, CA (US);

Inventors:

Yonggang He, Union City, CA (US);

Sze Meng Tan, Sunnyvale, CA (US);

Alejandro Dario Farinas, Mountain View, CA (US);

Assignee:

Picarro, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01);
Abstract

In cavity ring-down spectroscopy (CRDS), scattering into the backward mode of a traveling wave ring-down cavity can degrade conventional CRDS performance. We have found that this performance degradation can be alleviated by measuring the backward mode signal emitted from the ring-down cavity, and using this signal to improve the processing for extracting ring-down times from the measured data. For example, fitting an exponential to the sum of the intensities of the forward and backward signals often provides substantially better results for the ring-down time than fitting an exponential to the forward signal alone. Other possibilities include extracting cavity eigenmode signals from the forward and backward signals and performing separate exponential fits to the eigenmode signals. An optical circulator can be used to facilitate measurement of the backward mode signal.


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