The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Mar. 19, 2014
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventor:

Jyota Miyakura, Chiba, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06T 7/00 (2006.01); G01N 3/06 (2006.01); G01N 3/42 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01N 3/068 (2013.01); G01N 3/42 (2013.01); G06K 9/6203 (2013.01); G01N 2203/008 (2013.01); G01N 2203/0019 (2013.01); G01N 2203/0647 (2013.01);
Abstract

A hardness tester has an indentation former forming an indentation by pressing an indenter against a surface of a sample; an image capture controller controlling a CCD camera to capture an image of the surface of the sample and obtain image data; an indentation area extractor extracting an indentation area based on the obtained image data; and a hardness calculator calculating hardness of the sample based on the extracted indentation area. The indentation area extractor has a reduced image generator reducing the image obtained from the image data of the surface of the sample at a scale ratio selected from a plurality of predetermined scale ratios and generating a reduced image; and a pattern matcher performing pattern matching with respect to the generated reduced image and extracting the indentation area.


Find Patent Forward Citations

Loading…