The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Jul. 08, 2011
Applicants:
Satoshi Mitsuyama, Tokyo, JP;
Norio Owada, Naka, JP;
Chihiro Manri, Kawagoe, JP;
Sadamitsu Aso, Kawasaki, JP;
Inventors:
Satoshi Mitsuyama, Tokyo, JP;
Norio Owada, Naka, JP;
Chihiro Manri, Kawagoe, JP;
Sadamitsu Aso, Kawasaki, JP;
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 21/53 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01); G01N 21/25 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/53 (2013.01); G01N 15/1012 (2013.01); G01N 15/1459 (2013.01); G01N 21/25 (2013.01); G01N 21/64 (2013.01);
Abstract
Disclosed is a flow cytometer using a spectral device and a multi-detector, in which setting of an optimum wavelength band prior to measuring fluorescence intensity in real time is supported. A signal processing unit stores the intensities in multiple wavelength bands, the intensities being obtained by measuring a calibration sample, and the distribution of the intensities is calculated and displayed by each of the wavelength bands.