The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Jul. 21, 2014
Applicant:

Lsi Corporation, San Jose, CA (US);

Inventors:

Pervez M. Aziz, Dallas, TX (US);

Amaresh V. Malipatil, San Jose, CA (US);

Mohammad S. Mobin, Orefield, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/04 (2006.01); H04L 25/03 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03057 (2013.01);
Abstract

Described embodiments include a process and apparatus that takes into account the operating voltage and temperature (VT) variations of a SERDES receiver implemented in an integrated circuit (IC) or system-on-chip (SoC). An analog equalizer (AEQ) adaptation loop and a decision feedback equalizer (DFE) adaptation loop are disabled after the loops have converged or stabilized the parameters of the AEQ and DFE. While the AFE and DFE adaptation loops are disabled, certain monitor coefficients related to signals corrected by the AFE and DFE are adapted and metrics derived therefrom are generated. The metrics are compared to threshold values to check if they have sufficiently changed over time to warrant re-enabling of the AFE and DFE adaptation loops.


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