The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
May. 19, 2014
Applicant:
Sandisk Technologies Inc., Plano, TX (US);
Inventors:
Chris Avila, Saratoga, CA (US);
Gautam Dusija, Milpitas, CA (US);
Jian Chen, Menlo Park, CA (US);
Yingda Dong, San Jose, CA (US);
Man Mui, Fremont, CA (US);
Seungpil Lee, San Ramon, CA (US);
Alex Mak, Los Altos Hills, CA (US);
Assignee:
SanDisk Technologies Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/34 (2006.01); G11C 29/04 (2006.01); G06F 11/10 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3404 (2013.01); G06F 11/1048 (2013.01); G06F 11/1497 (2013.01); G11C 29/04 (2013.01);
Abstract
When data from a portion of a three dimensional NAND memory array is determined to be uncorrectable by Error Correction Code (ECC), a determination is made as to whether data is uncorrectable by ECC throughout some unit that is larger than the portion. If modified read conditions provide ECC correctable data, the modified read conditions are recorded for subsequent reads of the larger unit.