The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Feb. 05, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Lee D. Whetsel, Parker, TX (US);
Joel J. Graber, Richardson, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318544 (2013.01); G01R 31/3177 (2013.01); G01R 31/31721 (2013.01); G01R 31/31858 (2013.01); G01R 31/318541 (2013.01); G01R 31/318547 (2013.01); G01R 31/318575 (2013.01); G01R 31/318586 (2013.01);
Abstract
Scan and Scan-BIST architectures are commonly used to test digital circuitry in integrated circuits. The present disclosure improves upon low power Scan and Scan-BIST methods. The improvement allows the low power Scan and Scan-BIST architectures to achieve a delay test capability equally as effective as the delay test capabilities used in conventional scan and Scan-BIST architectures.