The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9103879 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 11, 2015

Filed:

Feb. 27, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Steven M. Douskey, Rochester, MN (US);

Ryan A. Fitch, Southfield, MI (US);

Michael J. Hamilton, Rochester, MN (US);

Amanda R. Kaufer, Rochester, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/318544 (2013.01); G01R 31/318563 (2013.01);
Abstract

An apparatus and method is provided for switching input pins to scan channels to increase test coverage. In one embodiment, a scan system connects a small number of input pins to several scan channels so that the input pins may be selectively switched. The input pins may transmit independent test vectors to test a large number of test areas on a semiconductor chip. The scan system may include a switching device such as a multiplexer (MUX).


Find Patent Forward Citations

Douskey, Steven. (2015). Test coverage of integrated circuits with test vector input spreading (U.S. Patent No. 9103879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9103879

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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