The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Jan. 13, 2010
Applicants:

John L. Vampola, Santa Barbara, CA (US);

William H. Frye, Goleta, CA (US);

Sean P. Kilcoyne, Lompoc, CA (US);

Inventors:

John L. Vampola, Santa Barbara, CA (US);

William H. Frye, Goleta, CA (US);

Sean P. Kilcoyne, Lompoc, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2011.01); H04N 3/14 (2006.01); H04N 5/372 (2011.01);
U.S. Cl.
CPC ...
H04N 3/1525 (2013.01); H04N 5/37206 (2013.01);
Abstract

In certain embodiments, an imaging device includes an image sensor that includes a detector array. The detector array includes a plurality of detectors operable to receive a charge generated by light. The detector array also includes a plurality of detector sub-arrays each including one or more of the plurality of detectors. The one or more detectors of each detector sub-array are in a time delay and integration (TDI) configuration. The image sensor of the imaging device is operable to, for each of the plurality of detector sub-arrays of the detector array, generate an image signal corresponding to a scan of an object.


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