The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Dec. 21, 2011
Michele Dalla-torre, Givataim, IL;
Gil Shabat, Raanana, IL;
Adi Dafni, Kibbutz Givat Brener, IL;
Amit Batikoff, Petach Tikva, IL;
Michele Dalla-Torre, Givataim, IL;
Gil Shabat, Raanana, IL;
Adi Dafni, Kibbutz Givat Brener, IL;
Amit Batikoff, Petach Tikva, IL;
Applied Materials Israel, Ltd., Rehovot, IL;
Abstract
In accordance with an aspect of the presently disclosed subject matter, there is provided an analysis system for classifying possible defects identified within an inspection image of an inspected object, the system comprising a pattern matcher configured to determine an anchor location with respect to the inspection image, based on a matching of a template and a portion of the inspection image; wherein an accuracy of the determining of the anchor location exceeds a resolution of the inspection image; a distribution analysis module configured to determine, based on the anchor location and a mask which defines different segments within an area, a distribution of a potential defect with respect to one or more of the segments; and a classifier, configured to classify the potential defect based on the distribution.