The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Jun. 25, 2013
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Tsung-Hsiung Lee, New Taipei, TW;
Kuang-Kai Yen, Kaohsiung, TW;
Shi-Hung Wang, Houli Township, TW;
Yung-Hsu Chuang, Hsinchu, TW;
Huan-Neng Chen, Taichung, TW;
Wei-Li Chen, Hsin-Chu, TW;
Shih-Hung Lan, Jhubei, TW;
Yi-Hsuan Liu, Hualien, TW;
Fan-Ming Kuo, Zhubei, TW;
Hsieh-Hung Hsieh, Taipei, TW;
Chewn-Pu Jou, Hsin-Chu, TW;
Fu-Lung Hsueh, Kaohsiung, TW;
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Abstract
A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the plurality of dies and to convert the received electromagnetic signals into commands. The ID decoder is configured to receive the commands and to generate an expect ID. The comparator is configured to compare the unique ID with the expect ID to generate a comparison result. The comparison result is arranged to decide if the tag core is configured to receive commands.