The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Jun. 20, 2008
Applicants:
Yaron Peri-glass, Raanana, IL;
Don J. O'riordan, Sunnyvale, CA (US);
Erica Brand, Palo Alto, CA (US);
Inventors:
Yaron Peri-Glass, Raanana, IL;
Don J. O'Riordan, Sunnyvale, CA (US);
Erica Brand, Palo Alto, CA (US);
Assignee:
Cadence Design Systems, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 8/38 (2013.01);
Abstract
A system and method is described in which the state of the art in automated software applications is significantly improved. According to some approaches, interface testing is implemented and based upon a verification language and a verification environment. The system and method support the concepts of constrained random test generation, coverage, constrained random generation, and dynamic checks.