The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

Jul. 24, 2013
Applicant:

Jenoptik Optical Systems Gmbh, Jena, DE;

Inventors:

Ullrich Krueger, Milda, DE;

Thomas Dressler, Jena, DE;

Stefan Heinemann, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/12 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 26/124 (2013.01); G02B 27/005 (2013.01); G02B 27/0031 (2013.01);
Abstract

An achromatic scanner in which pre-scan optics and post-scan optics are designed and disposed with respect to one another in such a way that for a light beam imaged onto the target surface a first image plane of the pre-scan optics coincides with a first object plane of the post-scan optics for a first beam portion and a second image plane of the pre-scan optics coincides with a second object plane of the post-scan optics for a second beam portion, wherein an image plane of the post-scan optics which lies on the target surface is associated with the first object plane of the post-scan optics and the second object plane of the post-scan optics.


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