The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Dec. 10, 2010
Takashi Nakamura, Yokohama, JP;
Akitoshi Yamada, Yokohama, JP;
Okinori Tsuchiya, Yokohama, JP;
Akihiko Nakatani, Kawasaki, JP;
Mitsuhiro Ono, Tokyo, JP;
Ayumi Sano, Kawasaki, JP;
Takashi Fujita, Kawasaki, JP;
Tomokazu Ishikawa, Kawasaki, JP;
Hidetsugu Kagawa, Kawasaki, JP;
Yugo Mochizuki, Kawasaki, JP;
Fumihiro Goto, Kawasaki, JP;
Fumitaka Goto, Tokyo, JP;
Takashi Nakamura, Yokohama, JP;
Akitoshi Yamada, Yokohama, JP;
Okinori Tsuchiya, Yokohama, JP;
Akihiko Nakatani, Kawasaki, JP;
Mitsuhiro Ono, Tokyo, JP;
Ayumi Sano, Kawasaki, JP;
Takashi Fujita, Kawasaki, JP;
Tomokazu Ishikawa, Kawasaki, JP;
Hidetsugu Kagawa, Kawasaki, JP;
Yugo Mochizuki, Kawasaki, JP;
Fumihiro Goto, Kawasaki, JP;
Fumitaka Goto, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
In an overlapping head including a plurality of recording head chips overlapped to each other, a color shift can occur between a color recorded by an overlapping region and a color recorded by a non-overlapping region, which cannot be corrected by a density correction using head shading or the like. To correct such a color shift, a test pattern is recorded by the overlapping region and the non-overlapping region and colors of the recorded test pattern are measured. Color correction data to be used in correction of colors of an image to be recorded is generated based on a result of the measurement of the colors.