The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Mar. 14, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Bing Sun, Tarrytown, NY (US);

Min Dai, Mahwah, NJ (US);

Srinivasan Rangarajan, Fishkill, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01); G01N 23/227 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2273 (2013.01); G01N 2223/6113 (2013.01);
Abstract

Systems and methods for performing X-ray Photoelectron Spectroscopy (XPS) measurements in a semiconductor environment are disclosed. A reference element peak is selected and tracked as part of the measurement process. Peak shift of the reference element peak, in electron volts (eV) is tracked and applied to other portions of acquired spectrum to compensate for the shift, which results from surface charge fluctuation.


Find Patent Forward Citations

Loading…