The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Feb. 03, 2012
Applicants:

Masuyuki Sugiyama, Hino, JP;

Yuichiro Hashimoto, Tachikawa, JP;

Hideki Hasegawa, Tachikawa, JP;

Shuhei Hashiba, Wako, JP;

Shun Kumano, Kokubunji, JP;

Inventors:

Masuyuki Sugiyama, Hino, JP;

Yuichiro Hashimoto, Tachikawa, JP;

Hideki Hasegawa, Tachikawa, JP;

Shuhei Hashiba, Wako, JP;

Shun Kumano, Kokubunji, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); H01J 49/0045 (2013.01);
Abstract

A variation in an ionization efficiency and the amount of sample which is introduced into an ion trap is corrected and quantified. Ions of an internal standard and ions of a sample are trapped in the ion trap at the same time, and a concentration of the sample is quantified according to an intensity of the ions of the internal standard which are mass-selectively ejected, and an intensity of fragment ions of the sample.


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