The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Dec. 10, 2012
Tokyo Seimitsu Co., Ltd., Hachioji-shi, Tokyo, JP;
Yasuhiro Yamauchi, Hachioji, JP;
Takashi Fujita, Hachioji, JP;
Tokyo Seimitsu Co., Ltd., Hachioji-shi, JP;
Abstract
A contour and surface texture measuring instrument for measuring a contour and surface texture of a surface of a work, which generates a displacement signal having a high resolution and high linearity in a wide measurement range is disclosed, the contour and surface texture measuring instrument having a measurement part having a stylus configured to come into contact with the surface of the work and to change its position vertically, a feed mechanism configured to move the work with respect to the stylus, an arm having the measurement part at one end and configured to transfer a displacement of the stylus to rotate with a pivot, and a differential transformer-type measuring mechanism and a scale-type measuring mechanism attached to the arm or to a position interlocked with the arm and configured to detect a displacement of the stylus.