The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Jul. 06, 2012
Applicants:

Gun Hee Kim, Chungbuk, KR;

Jae Woo Park, Seongnam-si, KR;

Jin Hyun Park, Gyeongju-si, KR;

Byung Du Ahn, Hwaseong-si, KR;

Je Hun Lee, Seoul, KR;

Yeon Hong Kim, Suncheon-si, KR;

Jung Hwa Kim, Gunpo-si, KR;

Sei-yong Park, Suwon-si, KR;

Jun Hyun Park, Gangwon-do, KR;

Kyoung Won Lee, Ansan-si, KR;

Ji Hun Lim, Goyang-si, KR;

Inventors:

Gun Hee Kim, Chungbuk, KR;

Jae Woo Park, Seongnam-si, KR;

Jin Hyun Park, Gyeongju-si, KR;

Byung Du Ahn, Hwaseong-si, KR;

Je Hun Lee, Seoul, KR;

Yeon Hong Kim, Suncheon-si, KR;

Jung Hwa Kim, Gunpo-si, KR;

Sei-Yong Park, Suwon-si, KR;

Jun Hyun Park, Gangwon-do, KR;

Kyoung Won Lee, Ansan-si, KR;

Ji Hun Lim, Goyang-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/12 (2006.01); H01L 21/00 (2006.01); H01L 29/786 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7869 (2013.01); H01L 21/02554 (2013.01);
Abstract

A semiconductor device includes: a substrate, a semiconductor layer including an oxide semiconductor disposed on the substrate, a barrier layer disposed on the semiconductor layer and an insulating layer disposed on the barrier layer. The semiconductor layer includes an oxide semiconductor, and the barrier layer includes a material having a lower standard electrode potential than a semiconductor material of the oxide semiconductor, a lower electron affinity than the semiconductor material of the oxide semiconductor, or a larger band gap than the semiconductor material of the oxide semiconductor. The insulating layer includes at least one of a silicon-based oxide or a silicon-based nitride, and the insulating layer includes a portion which contacts with an upper surface of the barrier layer.


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