The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Dec. 05, 2012
International Business Machines Corporation, Armonk, NY (US);
Steven M. Douskey, Rochester, MN (US);
Ryan A. Fitch, Southfield, MI (US);
Michael J. Hamilton, Rochester, MN (US);
Amanda R. Kaufer, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and structure tests a system on a chip (SoC) or other integrated circuit having multiple cores for chip characterization to produce a partial good status. A Self Evaluation Engine (SEE) on each core creates a quality metric or partial good value for the core. The SEE executes one or more tests to create a characterization signature for the core. The SEE then compares the characterization signature of a core with a characterization signature of neighboring cores to determine the partial good value for the core. The SEE may output a result to create a full characterization map for detailed diagnostics or a partial good map with values for all cores to produce a partial good status for the entire SoC.