The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Apr. 24, 2012
Applicants:

Katsutoshi Ono, Tokyo, JP;

Yu Ishii, Tokyo, JP;

Hisanori Matsuo, Tokyo, JP;

Kuniaki Yamaguchi, Tokyo, JP;

Inventors:

Katsutoshi Ono, Tokyo, JP;

Yu Ishii, Tokyo, JP;

Hisanori Matsuo, Tokyo, JP;

Kuniaki Yamaguchi, Tokyo, JP;

Assignee:

EBARA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 37/015 (2012.01); B24B 37/04 (2012.01); B24B 37/10 (2012.01); B24B 57/02 (2006.01);
U.S. Cl.
CPC ...
B24B 37/015 (2013.01); B24B 37/042 (2013.01); B24B 37/105 (2013.01); B24B 57/02 (2013.01);
Abstract

A polishing method for reducing an amount of polishing liquid used without lowering a polishing rate is provided. The polishing method comprises determining, in advance, the relationship between a supply flow rate of a polishing liquid and a polishing rate at the time the substrate is polished without controlling a surface temperature of the polishing pad, and the relationship between a supply flow rate of a polishing liquid and a polishing rate at the time the substrate is polished while controlling a surface temperature of the polishing pad at a predetermined level, and continuously supplying the polishing liquid to the surface of the polishing pad to achieve a higher polishing rate when the substrate is polished while controlling the surface temperature of the polishing pad at the predetermined level, than when the substrate is polished without controlling the surface temperature of the polishing pad.


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