The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Jul. 16, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Fabian Koehler, Dresden, DE;

Itasham Hussain, Dresden, DE;

Bianca Antonioli-Trepte, Stolpen, DE;

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/28 (2006.01); H01L 29/78 (2006.01); H01L 29/51 (2006.01);
U.S. Cl.
CPC ...
H01L 29/6656 (2013.01); H01L 29/6659 (2013.01); H01L 29/7833 (2013.01); H01L 21/28176 (2013.01); H01L 21/28202 (2013.01); H01L 29/518 (2013.01);
Abstract

When forming spacer structures enclosing a gate electrode structure of a transistor, a common problem is given by the thickness variation of the spacer structure obtained as a result of a first deposition process performed in a first chamber and a second, subsequent process performed in a second chamber. The present disclosure provides a method for forming spacers of a well-defined thickness. The method relies on a single deposition step performed by means of an atomic layer deposition. The deposition is performed in two stages performed at different temperatures.


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