The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Aug. 12, 2010
Applicants:

Paul W. Sanders, Scottsdale, AZ (US);

Wayne R. Burger, Phoenix, AZ (US);

Thuy B. Dao, Austin, TX (US);

Joel E. Keys, Austin, TX (US);

Michael F. Petras, Phoenix, AZ (US);

Robert A. Pryor, Mesa, AZ (US);

Xiaowei Ren, Phoenix, AZ (US);

Inventors:

Paul W. Sanders, Scottsdale, AZ (US);

Wayne R. Burger, Phoenix, AZ (US);

Thuy B. Dao, Austin, TX (US);

Joel E. Keys, Austin, TX (US);

Michael F. Petras, Phoenix, AZ (US);

Robert A. Pryor, Mesa, AZ (US);

Xiaowei Ren, Phoenix, AZ (US);

Assignee:

FREESCALE SEMICONDUCTOR INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/522 (2006.01); H01L 27/06 (2006.01); H01L 23/48 (2006.01); H01L 23/66 (2006.01); H03F 3/195 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0617 (2013.01); H01L 23/5226 (2013.01); H01L 23/481 (2013.01); H01L 23/5223 (2013.01); H01L 23/5227 (2013.01); H01L 23/66 (2013.01); H01L 2223/6616 (2013.01); H01L 2223/6655 (2013.01); H01L 2223/6683 (2013.01); H01L 2924/12044 (2013.01); H03F 3/195 (2013.01); H01L 24/49 (2013.01); H01L 2224/49175 (2013.01); H01L 2924/1423 (2013.01); H01L 2924/30107 (2013.01); H01L 2224/48091 (2013.01);
Abstract

Low Q associated with passive components of monolithic integrated circuits (ICs) when operated at microwave frequencies can be avoided or mitigated using high resistivity (e.g., ≧100 Ohm-cm) semiconductor substrates () and lower resistance inductors (') for the IC (). This eliminates significant in-substrate electromagnetic coupling losses from planar inductors () and interconnections (--″) overlying the substrate (). The active transistor(s) (′) are formed in the substrate () proximate the front face (). Planar capacitors (′) are also formed over the front face () of the substrate (). Various terminals (------′, etc.) of the transistor(s) (′), capacitor(s) (′) and inductor(s) (′) are coupled to a ground plane () on the rear face () of the substrate () using through-substrate-vias (′) to minimize parasitic resistance. Parasitic resistance associated with the planar inductors (′) and heavy current carrying conductors (-′) is minimized by placing them on the outer surface of the IC where they can be made substantially thicker and of lower resistance. The result is a monolithic microwave IC () previously unobtainable.


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