The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Dec. 22, 2008
Applicants:
Stephen E. Mick, Apex, NC (US);
John Damiano, Apex, NC (US);
David P. Nackashi, Raleigh, NC (US);
Inventors:
Assignee:
PROTOCHIPS, INC., Raleigh, NC (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); H01J 37/20 (2006.01); G02B 21/30 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); G02B 21/30 (2013.01); H01J 37/28 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/2008 (2013.01);
Abstract
Mounts, stages, and systems that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope. The mounts fixture and interface with a device, wherein the device corresponds to a structure that holds a specimen for microscopic imaging. The mounts are mateably and/or electrically compatible with a stage. Systems using the devices, mounts, and stages that can be used directly within the electron microscope are disclosed.