The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Mar. 14, 2013
Cameron B. Mcnairy, Windsor, CO (US);
Anil Agrawal, Santa Clara, CA (US);
Jenna S. Mayfield, Fort Collins, CO (US);
Eric A. Gouldey, Fort Collins, CO (US);
Mark Millican, Fort Collins, CO (US);
Cameron B. McNairy, Windsor, CO (US);
Anil Agrawal, Santa Clara, CA (US);
Jenna S. Mayfield, Fort Collins, CO (US);
Eric A. Gouldey, Fort Collins, CO (US);
Mark Millican, Fort Collins, CO (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A method for detecting errors in a processing device is disclosed. A data source unit of a processing device transmits data and a qualifier synchronously with the data, the qualifier to indicate the data is uncorrectable. At least one intermediate functional unit in the processing device receives the data and the qualifier. The at least one intermediate functional unit detects the data is uncorrectable based on the qualifier. The at least one intermediate functional unit transmits, without using, the data and the qualifier synchronously with the data to a data consumer unit of the processing device. The data consumer unit receives the data and the qualifier. The data consumer unit detects the data is uncorrectable based on the qualifier. The data consumer unit maintains, without using the data and the qualifier.