The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Mar. 06, 2010
Johannes Knoblich, Jena, DE;
Johannes Winterot, Jena, DE;
Tobias Kaufhold, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A microscope comprising multiple optical systems in the imaging beam path and at least one subassembly, the optical effect of which in relation to the imaging beam path can be modified by controlling the subassembly, e.g. a group of lenses or a diaphragm that can be moved in the direction of the optical axis, a diaphragm having a variable aperture, a digital zoom device, a shutter, or a focusing device. The microscope includes a control unit which is designed to generate control signals for the subassembly in a first mode of operation to regulate or control the functional parameters exclusively of the imaging optical system with which the subassembly is associated, and additionally in a second mode of operation to regulate or control the functional parameters of the entire optical system of the microscope.