The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Dec. 04, 2009
Masashi Akutsu, Hitachinaka, JP;
Shigeki Matsubara, Hitachinaka, JP;
Yoshimitsu Takagi, Hitachinaka, JP;
Hitoshi Tokieda, Hitachinaka, JP;
Masashi Akutsu, Hitachinaka, JP;
Shigeki Matsubara, Hitachinaka, JP;
Yoshimitsu Takagi, Hitachinaka, JP;
Hitoshi Tokieda, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analyzer is provided that can promptly process a request for additional test items for a sample being analyzed or an error that has occurred in the sample. The automatic analyzer can output measurements of a sample analyzed, determine whether or not re-analyzing is necessary, and perform the re-analyzing. The automatic analyzer includes a buffer area for standby until analysis is completed and measurements are outputted. Each of analysis units includes a pair of buffer units that can randomly access the buffer area. The automatic analyzer further includes a position disposed near the buffer area, at which a sample can be unloaded and reloaded. A rack that stands by within the buffer area can be unloaded onto the unloading position by a command to unload issued by an operator. Subsequent reloading of the sample allows samples other than the sample in question to be analyzed continuously.