The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Sep. 28, 2012
Abram M. Detofsky, Tigard, OR (US);
Chukwunenye S. Nnebe, Folsom, CA (US);
Brett D. Grossman, Forest Grove, OR (US);
Abram M. Detofsky, Tigard, OR (US);
Chukwunenye S. Nnebe, Folsom, CA (US);
Brett D. Grossman, Forest Grove, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A mechanism is described for facilitating optical testing of a device under test (DUT) using a testing mechanism having multiple testing paths according to one embodiment. A method of embodiments of the invention may include facilitating, via a loopback path, optical testing of the DUT in a loopback configuration. The loopback configuration may allow for looping between one or more transmitters and one or more receivers of the DUT. The method may further include facilitating, via a spectral path, spectral measurements relating to the DUT.