The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Jan. 20, 2011
Luke D. Lacroix, Williston, VT (US);
Mark C. H. Lamorey, South Burlington, VT (US);
Steven F. Oakland, Colchester, VT (US);
Janak G. Patel, South Burlington, VT (US);
Kerry P. Pfarr, Rochester, MN (US);
Peter Slota, Jr., Vestal, NY (US);
David B. Stone, Jericho, VT (US);
Luke D. Lacroix, Williston, VT (US);
Mark C. H. Lamorey, South Burlington, VT (US);
Steven F. Oakland, Colchester, VT (US);
Janak G. Patel, South Burlington, VT (US);
Kerry P. Pfarr, Rochester, MN (US);
Peter Slota, Jr., Vestal, NY (US);
David B. Stone, Jericho, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Detection circuits, methods of use and manufacture and design structures are provided herein. The structure includes at least one signal line traversing one or more metal layers of an integrated circuit. Circuitry is coupled to the at least one signal line, which is structured to receive a signal with a known signal from the at least one signal line or a signal from a different potential and, based on which signal is received, determine whether there is a structural defect in the integrated circuit.