The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Jan. 22, 2013
Applicants:
Advantest Corporation, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Inventors:
Takahiro Yamaguchi, Saitama, JP;
Satoshi Komatsu, Tokyo, JP;
Kunihiro Asada, Tokyo, JP;
James Sumit Tandon, Tokyo, JP;
Assignees:
ADVANTEST CORPORATION, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G01R 29/00 (2006.01);
U.S. Cl.
CPC ...
G01R 29/00 (2013.01);
Abstract
Provided is a measurement apparatus that measures an input signal, comprising a plurality of first comparators that each receive the input signal, have a common first reference level set therein, and compare a signal level of the input signal to the first reference level; and a level-crossing timing detecting section that detects a level-crossing timing at which the signal level crosses the first reference level, based on comparison results of the first comparators.