The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Apr. 19, 2012
Applicants:

Nicholas P. Cowley, Wroughton, GB;

Isaac Ali, Mississauga, CA;

Inventors:

Nicholas P. Cowley, Wroughton, GB;

Isaac Ali, Mississauga, CA;

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 1/08 (2006.01); H03M 1/10 (2006.01); H03M 1/00 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/08 (2013.01); H03M 1/00 (2013.01); H03M 1/12 (2013.01); H03M 1/0695 (2013.01); H03M 1/1028 (2013.01); H03M 1/1215 (2013.01);
Abstract

According to various embodiments, a system, an apparatus and a method are presented that relate to determining and correcting signal imbalances between output samples of an analog-to-digital (A-D) converter array (that may be implemented as part of a wideband ADC). A statistic module and correction module are associated with the A-D converter array. The statistic module is configured to receive digital samples from the plurality of A-D converters, and generate a statistical sample value for each A-D converter using a set of digital samples received therefrom. The correction module is configured to, for at least one of the plurality of A-D converters, determine an offset value by comparing the statistical sample value for the at least one of the plurality of A-D converters with a reference value, and apply the offset value to a digital sample from that at least one A-D converter to generate a corrected digital sample.


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