The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Dec. 17, 2012
Applicant:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Inventors:

John Chen, Shanghai, CN;

Simon Yang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01); H01L 21/77 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/165 (2006.01);
U.S. Cl.
CPC ...
H01L 21/77 (2013.01); H01L 21/823807 (2013.01); H01L 21/823814 (2013.01); H01L 29/165 (2013.01); H01L 29/66628 (2013.01); H01L 29/66636 (2013.01); H01L 29/7843 (2013.01); H01L 29/7848 (2013.01);
Abstract

A method for forming a CMOS integrated circuit device, the method including; providing a semiconductor substrate, forming a gate layer overlying the semiconductor substrate, patterning the gate layer to form NMOS and PMOS gate structures including edges; forming a first dielectric layer overlying the NMOS and PMOS gate structures to protect the NMOS and PMOS gate structures including the edges, forming a first masking layer overlying a first region adjacent the NMOS gate structure; etching a first source region and a first drain region adjacent to the PMOS gate structure using the first masking layer as a protective layer for the first region adjacent the NMOS gate structure, and depositing a silicon germanium material into the first source and drain regions to cause the channel region between the first source and drain regions of the PMOS gate structure to be strained in a compressive mode.


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