The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Sep. 12, 2013
Applicant:

Jeol Ltd., Tokyo, JP;

Inventor:

Takaya Satoh, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/04 (2006.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0004 (2013.01); H01J 49/40 (2013.01); H01J 49/0031 (2013.01); H01J 49/022 (2013.01); H01J 49/067 (2013.01);
Abstract

An imaging mass spectrometer capable of reducing the dependence of the resolution of a projection image on mass is offered. Also, a method of controlling this spectrometer is offered. The imaging mass spectrometer includes: a plate on which a sample is placed; a lens system through which ions generated by irradiating the sample with laser light pass; an ion optical system for separating the ions according to flight time corresponding to mass-to-charge ratio; a detection system for measuring arrival positions and flight times of the ions passed through the ion optical system and generating an image of the sample when it is ionized; and a voltage control portion for sweeping the voltage applied to an electrode included in the lens system such that the lens effect of the lens system increases with time during a given period synchronized with the laser irradiation.


Find Patent Forward Citations

Loading…