The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Jun. 01, 2007
Applicants:

Juan-lin Chen, Shanhua, TW;

Yung-fu Yeh, Sikou, TW;

Yuk-tong Lee, Fongshan, TW;

Nai-han Cheng, Hsinchu, TW;

Inventors:

Juan-Lin Chen, Shanhua, TW;

Yung-Fu Yeh, Sikou, TW;

Yuk-Tong Lee, Fongshan, TW;

Nai-Han Cheng, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/244 (2006.01); H01J 37/317 (2006.01); H01J 37/24 (2006.01); H01J 37/304 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3171 (2013.01); H01J 37/243 (2013.01); H01J 37/304 (2013.01); H01J 2237/30472 (2013.01); H01J 2237/31703 (2013.01);
Abstract

An apparatus for monitoring beam currents of an implanter is provided. The apparatus includes a beam-sensing unit for sensing the beam currents; a position-determining unit for determining scan positions; and a computing unit. The computing unit is configured to perform the functions of receiving the beam currents from the beam-sensing unit; receiving the scan positions from the position-determining unit; and determining a drift status of the implanter from the beam currents, wherein the computing unit is configured to receive the beam currents and the scan position periodically between a starting time and an ending time of a scan process of the implanter.


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