The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Sep. 23, 2010
Applicants:
John Damiano, Apex, NC (US);
Stephen Mick, Apex, NC (US);
David Nackashi, Raleigh, NC (US);
Inventors:
Assignee:
PROTOCHIPS, INC., Raleigh, NC (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); G01K 7/02 (2006.01); H01J 37/20 (2006.01); G01K 17/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); G01K 17/00 (2013.01); G01K 17/006 (2013.01); H01J 37/26 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2065 (2013.01); H01J 2237/28 (2013.01); H01J 2237/2003 (2013.01);
Abstract
Methods of using temperature control devices in electron microscopes. The temperature of the device structure may be controlled to extract information about reactions and processes that was previously unobtainable.