The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Jan. 18, 2011
Jong-kyu Hong, Gwangju-si, KR;
Moon-young Jeon, Seoul, KR;
Hong-min Kim, Seoul, KR;
Jung Hur, Bucheon-si, KR;
Sang-kyu Yun, Chungju-si, KR;
Jong-Kyu Hong, Gwangju-si, KR;
Moon-Young Jeon, Seoul, KR;
Hong-Min Kim, Seoul, KR;
Jung Hur, Bucheon-si, KR;
Sang-Kyu Yun, Chungju-si, KR;
KOH YOUNG TECHNOLOGY INC., Seoul, KR;
Abstract
An apparatus for inspecting a board is shown. The board inspection apparatus includes at least one illuminating module, an imaging lens, a first beam splitter, a first camera, and a second camera. The illuminating module provides light to an inspection board and the imaging lens transmits a light reflected from the inspection board. The first beam splitter transmits a portion of the light transmitted from the imaging lens and reflects the rest of the transmitted light. The first camera image-captures by receiving the light that transmits the first beam, and the second camera image-captures by receiving the light reflected from the first beam splitter. Therefore, by using one imaging lens to inspect the inspection board, the decrease in accuracy caused by the different optical axis or magnification may be prevented.