The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Feb. 29, 2008
Applicants:
John Damiano, Jr., Apex, NC (US);
Stephen E. Mick, Apex, NC (US);
David P. Nackashi, Raleigh, NC (US);
Inventors:
John Damiano, Jr., Apex, NC (US);
Stephen E. Mick, Apex, NC (US);
David P. Nackashi, Raleigh, NC (US);
Assignee:
PROTOCHIPS, INC., Raleigh, NC (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 5/10 (2006.01); G02B 21/34 (2006.01); B01L 3/00 (2006.01); G01N 1/31 (2006.01); G01N 1/36 (2006.01); G01N 1/42 (2006.01); H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
G02B 21/34 (2013.01); B01L 3/508 (2013.01); G01N 1/312 (2013.01); G01N 1/36 (2013.01); G01N 1/42 (2013.01); H01J 37/20 (2013.01); B01L 2300/0851 (2013.01); H01J 2237/2003 (2013.01);
Abstract
A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.