The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2015

Filed:

Oct. 30, 2012
Applicant:

Mks Instruments, Inc., Andover, MA (US);

Inventors:

Gerardo A. Brucker, Longmont, CO (US);

G. Jeffery Rathbone, Longmont, CO (US);

Brian J. Horvath, Thornton, CO (US);

Timothy C. Swinney, Fort Colling, CO (US);

Stephen C. Blouch, Boulder, CO (US);

Jeffrey G. McCarthy, Lafayette, CO (US);

Timothy R. Piwonka-Corle, Boulder, CO (US);

Assignee:

MKS Instruments, Inc., Andover, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/42 (2006.01); H01J 49/00 (2006.01); H01J 49/14 (2006.01); H01J 27/20 (2006.01);
U.S. Cl.
CPC ...
H01J 49/4245 (2013.01); H01J 49/0009 (2013.01); H01J 49/0031 (2013.01); H01J 49/147 (2013.01); H01J 27/205 (2013.01);
Abstract

An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters.


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